Author(s):
Fernandes, A. C. ; Vaz, F.
; Rebouta, L.
; Pinto, A.
; Alves, E.
; Parreira, N. M. G.
; Goudeau, Ph.
; Bourhis, E. Le
; Rivière, J. P.
Date: 2007
Persistent ID: http://hdl.handle.net/10316/4211
Origin: Estudo Geral - Universidade de Coimbra
Subject(s): X-ray diffraction; Phase transitions; Decorative films; Hardness