Detalhes do Documento

Raman study of doped-ZnO thin films

Autor(es): Cerqueira, M. F. cv logo 1 ; Rolo, Anabela G. cv logo 2 ; Viseu, T. M. R. cv logo 3 ; Campos, J. Ayres de cv logo 4 ; Arôso, T. de Lacerda cv logo 5 ; Oliveira, F. cv logo 6 ; Vasilevskiy, Mikhail cv logo 7 ; Alves, E. cv logo 8

Data: 2010

Identificador Persistente: http://hdl.handle.net/1822/13721

Origem: RepositóriUM - Universidade do Minho

Assunto(s): ZnO; Doping; Raman scattering; Phonons


Descrição
A Raman spectroscopy study of doped versus undoped ZnO layers is presented. The layers were grown by RF magnetron sputtering and the doping with Al, Sb and Mn was achieved by ion implantation with subsequent annealing. First-order Raman response measured under λ=488 nm excitation is discussed. It is shown that doping with any of the impurities used in this work produces a strong enhancement of the longitudinal optical (LO) phonon band, which is attributed to the intra-band Fröhlich mechanism. In addition, doping with Mn results in an extra mode located at 530 cm-1, tentatively attributed to a local vibrational mode of Mn substituting Zn in the lattice sites.
Tipo de Documento Artigo
Idioma Inglês
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