Author(s):
Soares, C. O. ; Silva, R. A.
; Carvalho, M. D.
; Jorge, M. E. Melo
; Gomes, A.
; Rangel, C. M.
Date: 2013
Persistent ID: http://hdl.handle.net/10400.9/1991
Origin: Repositório do LNEG
Subject(s): LaNiO3 films; Nickel-foam support ; Roughness; Cyclic voltammetry; Electrochemical impedance spectroscopy