Author(s):
José Machado da Silva 
Date: 2005
Persistent ID: http://hdl.handle.net/10216/71539
Origin: Repositório Aberto da Universidade do Porto
Subject(s): Ciências Tecnológicas; Engenharia; Engenharia electrónica
Document details
Low-Power In-Circuit Testing of a LNA
Description
A new technique is proposed to tackle in-circuit testing of embedded RF blocks. It relies on observing the cross-correlation between its output voltage and power supply current, using a translinear cross-correlator circuit. Although a structural test is performed, simulation results show that fault detection criteria can be established based on acceptable deviations of performance characterization parameters. The case of a Low Noise Amplifier is presented.
A new technique is proposed to tackle in-circuit testing of embedded RF blocks. It relies on observing the cross-correlation between its output voltage and power supply current, using a translinear cross-correlator circuit. Although a structural test is performed, simulation results show that fault detection criteria can be established based on acceptable deviations of performance characterization parameters. The case of a Low Noise Amplifier is presented.
Document Type
Conference Object
Language English
Language English
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