Low-Power In-Circuit Testing of a LNA

• Autor(es): José Machado da Silva
• Data: 2005
• Identificador Persistente: http://hdl.handle.net/10216/71539
• Origem: Repositório Aberto da Universidade do Porto
• Assunto(s): Ciências Tecnológicas; Engenharia; Engenharia electrónica
• Tipo de Documento: Documento de conferência
• Idioma: Inglês

Descrição

A new technique is proposed to tackle in-circuit testing of embedded RF blocks. It relies on observing the cross-correlation between its output voltage and power supply current, using a translinear cross-correlator circuit. Although a structural test is performed, simulation results show that fault detection criteria can be established based on acceptable deviations of performance characterization parameters. The case of a Low Noise Amplifier is presented.