Author(s):
José Machado da Silva 
Date: 2006
Persistent ID: http://hdl.handle.net/10216/71518
Origin: Repositório Aberto da Universidade do Porto
Subject(s): Ciências Tecnológicas; Engenharia; Engenharia electrónica
Document details
A Low-Power Oscillation Based LNA BIST Scheme
Description
Abstract—Test stimuli generation and power consumption are two issues that jeopardize the design of built-in self test schemes. The LNA testing approach presented herein relies on converting the amplifier into an oscillator and on using a low-power correlator to obtain a signature from the cross-correlation between the dynamic power supply current and the LNA’s output voltage. In test mode a high fault coverage is obtained together with a low power consumption, while avoiding an extra stimulus generator. No significant performance degradation results from the added test circuitry. Concerning the interface with the external tester, a digital signal is required to switch between normal and test modes, as well as a low frequency line to capture the correlator DC output voltage.
Abstract—Test stimuli generation and power consumption are two issues that jeopardize the design of built-in self test schemes. The LNA testing approach presented herein relies on converting the amplifier into an oscillator and on using a low-power correlator to obtain a signature from the cross-correlation between the dynamic power supply current and the LNA’s output voltage. In test mode a high fault coverage is obtained together with a low power consumption, while avoiding an extra stimulus generator. No significant performance degradation results from the added test circuitry. Concerning the interface with the external tester, a digital signal is required to switch between normal and test modes, as well as a low frequency line to capture the correlator DC output voltage.
Document Type
Conference Object
Language Portuguese
Language Portuguese
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