Angle-scanned photoemission: Fermi surface mapping and structural determination

• Autor(es): Aebi, P. ; Fasel, R. ; Naumovic, D. ; Hayoz, J. ; Pillo, Th. ; Bovet, M. ; Agostino, R. G. ; Patthey, L. ; Schlapbach, L. ; Gil, F. P. ; Berger, H. ; Kreutz, T. J. ; Osterwalder, J.
• Data: 1998
• Identificador Persistente: http://hdl.handle.net/10316/4567
• Origem: Estudo Geral - Universidade de Coimbra
• Assunto(s): Angle-scanned photoemission; Band mapping; Fermi surface mapping; Photoelectron diffraction; Surface structure
• Tipo de Documento: Artigo
• Idioma: Inglês

Descrição

A brief survey of the angle-scanned photoemission technique is given. It incorporates two complementary methods in one: http://www.sciencedirect.com/science/article/B6TVX-3X82696-4F/1/e2ffd4efc660238ad8d4ad8f685991bf