Author(s):
Piroto Duarte, J. ; Gil, J. M.
; Alberto, H. V.
; Vilão, R. C.
; Weidinger, A.
; Ayres de Campos, N.
; Cox, S. F. J.
; Lord, J. S.
; Cottrell, S. P.
; Davis, E. A.
Date: 2006
Persistent ID: http://hdl.handle.net/10316/4409
Origin: Estudo Geral - Universidade de Coimbra
Subject(s): II-VI Semiconductors; Mercury oxide; Muonium diffusion