Detalhes do Documento

Effects of ion bombardment on properties of d.c. sputtered superhard (Ti, Si, A...

Autor(es): Ribeiro, E. cv logo 1 ; Malczyk, A. cv logo 2 ; Carvalho, S. cv logo 3 ; Rebouta, L. cv logo 4 ; Fernandes, J. V. cv logo 5 ; Alves, E. cv logo 6 ; Miranda, A. S. cv logo 7

Data: 2002

Identificador Persistente: http://hdl.handle.net/10316/4286

Origem: Estudo Geral - Universidade de Coimbra

Assunto(s): Ti---Al---Si---N; Superhard coatings; Nanocomposites; Mechanical properties; Wear rate


Descrição
A d.c. reactive magnetron sputtering technique was used to deposit (Ti, Si, Al)N films. The ion current density in the substrate was varied by the superimposition of an axially symmetric external magnetic field between the substrate and target. It was found that the variation of the magnetic field strength induced changes in the ion current density in the substrate with a consequent change in film properties. XRD patterns of sputtered films revealed changes of the lattice parameter (from 0.418 nm to approx. 0.429 nm) with the increase of the ion/atom arrival rate ratio. As already reported for samples prepared by r.f. sputtering, both can be assigned to a cubic B1 NaCl structure, typical for TiN. The lowest lattice parameter corresponds to a metastable phase where Si and Al atoms occupy Ti positions, while the highest lattice parameter corresponds to a system where at least a partial segregation of TiN and SiNx phases already occurred, leading to the formation of a nanocomposite film of the type nc-TiAlN/a-Si3N4. The mixture of the metastable phase with nanocomposite coating phases in some samples indicates that, in general, the segregation of TiN and SiNx phases is not complete. Hardness values as high as 45 GPa were measured. Small Si additions to (Ti, Al)N coatings induce a reduction in the pin-on-disk sliding wear rate. http://www.sciencedirect.com/science/article/B6TVV-45NNYWN-3H/1/92844a2a3f6b9e4e8976dda41dc14caa
Tipo de Documento Artigo
Idioma Inglês
delicious logo  facebook logo  linkedin logo  twitter logo 
degois logo
mendeley logo

Documentos Relacionados



    Financiadores do RCAAP

Fundação para a Ciência e a Tecnologia Universidade do Minho   Governo Português Ministério da Educação e Ciência Programa Operacional da Sociedade do Conhecimento União Europeia