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Crystal size and crystalline volume fraction effects on the Erbium emission of ...
Cerqueira, M. F.; Stepikhova, M.; Kozanecki, A.; Andrês, G.; Alves, E.Erbium-doped low-dimensional Si films with different microstructures were grown by reactive magnetron sputtering on glass substrates by varying the deposition parameters. Their structure and chemical composition were studied by micro-Raman and Rutherford backscattering spectrometry, respectively. In this contribution the Erbium emission is studied as a function of nanocrystalline fraction and average crystal si...
Photoluminescence of nc-Si:Er thin films obtained by physical and chemical vapo...
Cerqueira, M. F.; Losurdo, M.; Stepikhova, M.; Alpuim, P.; Andrês, G.; Kozanecki, A.; Soares, Manuel Jorge; Peres, M.Erbium doped nanocrystalline silicon (nc-Si:Er) thin films were produced by reactive magnetron rf sputtering and by Er ion implantation into chemical vapor deposited Si films. The structure and chemical composition of films obtained by the two approaches were studied by micro-Raman scattering, spectroscopic ellipsometry and Rutherford backscattering techniques. Variation of deposition parameters was used to dep...
Visible and infrared photoluminescence from erbium-doped silicon nanocrystals p...
Cerqueira, M. F.; Losurdo, M.; Monteiro, T.; Stepikhova, M.; Soares, Manuel Jorge; Peres, M.; Alpuim, P.Erbium-doped low-dimensional Si films with different microstructures were deposited by reactive magnetron sputtering on glass substrates by varying the hydrogen flow rate during deposition. Amorphous, micro- and nanocrystalline samples, consisting of Si nanocrystalls embedded in silicon-based matrices with different structures, were achieved with optical properties in the visible and IR depending on nanocrystal...
Effect of the matrix on the 1.5 μm photoluminescence of Er-doped silicon quantu...
Cerqueira, M.F.; Stepikhova, M.; Losurdo, M.; Monteiro, T.; Soares, M.J.; Peres, M.; Neves, A.; Alves, E.Erbium doped nanocrystalline silicon thin films were produced by reactive magnetron r.f sputtering. Their structural and chemical properties were studied by micro-Raman, spectroscopic ellipsometry and Rutherford backscattering spectroscopy. Films with different crystalline fraction and crystallite size were deposited by changing the deposition parameters. The impact of the composition and structure of Erbium io...
Erbium-doped silicon nanocrystals grown by r.f. sputtering method: competition ...
Cerqueira, M. F.; Stepikhova, M.; Losurdo, M.; Giangregorio, M. M.; Kozanecki, A.; Monteiro, T.Erbium doped micro- and nanocrystalline silicon thin films have been deposited by co-sputtering of Er and Si. Films with different crystallinity, crystallite size, hydrogen and oxygen content have been obtained in order to investigate the effect of the microstructure and composition of matrix on the near IR range at 1.54 µm Er-related photoluminescence (PL) properties. The correlation between the optical proper...
Study of the oxygen role in the photoluminescence of erbium doped nanocrystalli...
Cerqueira, M. F.; Losurdo, M.; Monteiro, T.; Stepikhova, M.; Soares, M. J.; Peres, M.; Alves, E.; Conde, O.We have produced and studied erbium doped nanocrystalline silicon thin films with different oxygen and hydrogen content in order to evaluate the influence of the matrix on the Er3+ emission and on the 0.89 eV and 1.17 eV bands. Films were grown by reactive magnetron sputtering on glass substrates under several different conditions (RF power, Er content and gas mixture composition) in order to obtain different m...
Effect of the matrix on the 1.5 microm photoluminescence of Er-doped silicon qu...
Cerqueira, M. F.; Stepikhova, M.; Losurdo, M.; Monteiro, T.; Soares, Manuel Jorge; Peres, M.; Neves, A.; Alves, E.Erbium doped nanocrystalline silicon thin films were produced by reactive magnetron r.f. sputtering. Their structural and chemical properties were studied by micro-Raman, spectroscopic ellipsometry and Rutherford backscattering spectroscopy. Films with different crystalline fraction and crystallite size were deposited by changing the deposition parameters. The impact of the composition and structure of Erbium i...
Visible and near ir photoluminescent response of nc-si : er thin films produced...
Cerqueira, M. F.; Monteiro, T.; Stepikhova, M.; Losurdo, M.; Soares, M. J.; Gomes, I. TarrosoIn this contribution we present the Visible and near IR photoluminescence (PL) analysis of Er doped nanocrystalline silicon thin films produced by rf magnetron sputtering method. Efficient photoluminescence was observed in these structures in both visible and 1.54µm wavelength regions. We show the strong influence of the presence of nanocrystalline fraction in films on their luminescence efficiency at 1.54 μm t...
The role of microstructure in luminescent properties of Er-doped nanocrystallin...
Stepikhova, M.; Cerqueira, M. F.; Losurdo, M.; Giangregorio, M. M.; Alves, E.; Monteiro, T.; Soares, Manuel JorgeIn this contribution, we present a structural and photoluminescence (PL) analysis of Er-doped nanocrystalline silicon thin films produced by rf magnetron sputtering method. We show the strong influence of the presence of nanocrystalline fraction in films on their luminescence efficiency at 1.54 microm studied on a series of specially prepared samples with different crystallinity, i.e., percentage and sizes of S...
Influence of crystals distribution on the photoluminescence properties of nanoc...
Cerqueira, M. F.; Stepikhova, M.; Losurdo, M.; Giangregorio, M. M.; Alves, E.; Monteiro, T.; Soares, M. J.; Boemare, C.Nanocrystalline silicon thin films doped with erbium were produced by reactive magnetron RF sputtering. Their structural and chemical properties were studied by X-ray diffractometry at grazing incidence, micro-Raman, spectroscopic ellipsometry and Rutherford Backscattering Spectroscopy, respectively. Films with different crystalline fraction and crystallite size were deposited. Since the luminescence efficiency...
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