Non-resonant Raman spectroscopy studies of a set of CdS films annealed at different temperatures were performed and showed a direct correlation between the width of the Raman peak produced by CdS-like optical phonons and the crystalline quality of the semiconductor phase probed by x-ray diffraction (XRD) and transmission electron microscopy (TEM). In order to decribe the Raman lineshape a model proposed by Tral...
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