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Nanocrystalline Au:Ag:SnO2 films prepared by pulsed magnetron sputtering
Reddy, A. Sivasankar; Figueiredo, N. M.; Cavaleiro, A.Influence of annealing temperature on structural, compositional, surface morphology, electrical, and optical properties of pulsed magnetron sputtered nanocrystalline Au:Ag:SnO2 films was investigated by several analytical techniques. From the XRD results, the films were polycrystalline with the absence of impurity phases and the films were grown preferentially in the (110) orientation of SnO2 with tetragonal st...
Pulsed direct current magnetron sputtered nanocrystalline tin oxide films
Reddy, A. Sivasankar; Figueiredo, N. M.; Cavaleiro, A.The nanocrystalline tin oxide (SnO2) films were deposited on glass substrates by pulsed magnetron sputtering technique and subsequently annealed from 200 to 500 °C. The structural, microstructural, electrical, and optical properties of as deposited and annealed SnO2 films were studied. The crystallinity degree of the films increased with annealing temperature. Photoluminescence (PL) measurements showed that the...
Physical properties of In2O3 thin films prepared at various oxygen partial pres...
Kaleemulla, S.; Reddy, A. Sivasankar; Uthanna, S.; Reddy, P. Sreedharahttp://www.sciencedirect.com/science/article/B6TWY-4VDS8C6-5/2/b17183c97b173ec8a28b25ffd97e054c
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