Encontrados 5 documentos, a visualizar página 1 de 1
Crystal size and crystalline volume fraction effects on the Erbium emission of ...
Cerqueira, M. F.; Stepikhova, M.; Kozanecki, A.; Andrês, G.; Alves, E.Erbium-doped low-dimensional Si films with different microstructures were grown by reactive magnetron sputtering on glass substrates by varying the deposition parameters. Their structure and chemical composition were studied by micro-Raman and Rutherford backscattering spectrometry, respectively. In this contribution the Erbium emission is studied as a function of nanocrystalline fraction and average crystal si...
Erbium-doped nanocrystalline silicon thin films produced by RF sputtering : ann...
Cerqueira, M. F.; Monteiro, T.; Soares, Manuel Jorge; Kozanecki, A.; Alpuim, P.; Alves, E.In order to improve the transparent contact layer in amorphous silicon solar cells fabricated on low-temperature plastic substrates, Al and Ga doped ZnO films were deposited at room temperature on plastic and glass and their optical, electronic and structural properties were correlated and optimized. Aiming to explore light trapping effects, plastic substrates were laser textured and their haze and total transm...
Structural and photoluminescence studies of erbium implanted nanocrystalline si...
Cerqueira, M. F.; Alpuim, P.; Filonovich, Sergey; Alves, E.; Rolo, Anabela G.; Andrês, G.; Soares, J.; Kozanecki, A.Hydrogenated amorphous and nanocrystalline silicon thin films deposited by Hot Wire (HW) and Radio-Frequency Plasma-Enhanced (RF) Chemical Vapor Deposition were Er-bium-implanted. Their pre-implantation structural properties and post-implantation optical properties were studied and cor-related. After one-hour annealing at 150ºC in nitrogen atmos-phere only amorphous films showed photoluminescence (PL) activity ...
Photoluminescence of nc-Si:Er thin films obtained by physical and chemical vapo...
Cerqueira, M. F.; Losurdo, M.; Stepikhova, M.; Alpuim, P.; Andrês, G.; Kozanecki, A.; Soares, Manuel Jorge; Peres, M.Erbium doped nanocrystalline silicon (nc-Si:Er) thin films were produced by reactive magnetron rf sputtering and by Er ion implantation into chemical vapor deposited Si films. The structure and chemical composition of films obtained by the two approaches were studied by micro-Raman scattering, spectroscopic ellipsometry and Rutherford backscattering techniques. Variation of deposition parameters was used to dep...
Erbium-doped silicon nanocrystals grown by r.f. sputtering method: competition ...
Cerqueira, M. F.; Stepikhova, M.; Losurdo, M.; Giangregorio, M. M.; Kozanecki, A.; Monteiro, T.Erbium doped micro- and nanocrystalline silicon thin films have been deposited by co-sputtering of Er and Si. Films with different crystallinity, crystallite size, hydrogen and oxygen content have been obtained in order to investigate the effect of the microstructure and composition of matrix on the near IR range at 1.54 µm Er-related photoluminescence (PL) properties. The correlation between the optical proper...
| Financiadores do RCAAP | |||||||
|
|
|
|
|
|
||