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Erbium-doped silicon nanocrystals grown by r.f. sputtering method: competition ...
Cerqueira, M. F.; Stepikhova, M.; Losurdo, M.; Giangregorio, M. M.; Kozanecki, A.; Monteiro, T.Erbium doped micro- and nanocrystalline silicon thin films have been deposited by co-sputtering of Er and Si. Films with different crystallinity, crystallite size, hydrogen and oxygen content have been obtained in order to investigate the effect of the microstructure and composition of matrix on the near IR range at 1.54 µm Er-related photoluminescence (PL) properties. The correlation between the optical proper...
The role of microstructure in luminescent properties of Er-doped nanocrystallin...
Stepikhova, M.; Cerqueira, M. F.; Losurdo, M.; Giangregorio, M. M.; Alves, E.; Monteiro, T.; Soares, Manuel JorgeIn this contribution, we present a structural and photoluminescence (PL) analysis of Er-doped nanocrystalline silicon thin films produced by rf magnetron sputtering method. We show the strong influence of the presence of nanocrystalline fraction in films on their luminescence efficiency at 1.54 microm studied on a series of specially prepared samples with different crystallinity, i.e., percentage and sizes of S...
Influence of crystals distribution on the photoluminescence properties of nanoc...
Cerqueira, M. F.; Stepikhova, M.; Losurdo, M.; Giangregorio, M. M.; Alves, E.; Monteiro, T.; Soares, M. J.; Boemare, C.Nanocrystalline silicon thin films doped with erbium were produced by reactive magnetron RF sputtering. Their structural and chemical properties were studied by X-ray diffractometry at grazing incidence, micro-Raman, spectroscopic ellipsometry and Rutherford Backscattering Spectroscopy, respectively. Films with different crystalline fraction and crystallite size were deposited. Since the luminescence efficiency...
Interrelation between microstructure and optical properties of erbium-doped nan...
Losurdo, M.; Cerqueira, M. F.; Alves, E.; Stepikhova, M.; Giangregorio, M. M.; Bruno, G.Nanocrystalline silicon thin films codoped with erbium, oxygen and hydrogen have been deposited by co-sputtering of Er and Si. Films with different crystallinity, crystallite size and oxygen content have been obtained in order to investigate the effect of the microstructure on the photoluminescence properties. The correlation between the optical properties and microstructural parameters of the films is investig...
Dielectric function of nanocrystalline silicon with few nanometers (<3 nm) grai...
Losurdo, M.; Giangregorio, M. M.; Capezzuto, Pio; Bruno, G.; Cerqueira, M. F.; Alves, E.; Stepikhova, M.The dielectric function of nanocrystalline silicon (nc-Si) with crystallite size in the range of 1 to 3 nm has been determined by spectroscopic ellipsometry in the range of 1.5 to 5.5 eV. ATauc–Lorentz parameterization is used to model the nc-Si optical properties. The nc-Si dielectric function can be used to analyze nondestructively nc-Si thin films where nanocrystallites cannot be detected by x-ray diffractio...
The structure and photoluminescence of erbium-doped nanocrystalline silicon thi...
Cerqueira, M. F.; Losurdo, M.; Stepikhova, M.; Conde, O.; Giangregorio, M. M.; Pinto, Pedro; Ferreira, J. A.We have produced and studied undoped and erbium-doped nanocrystalline silicon thin films in order to evaluate the erbium influence on the film microstructure and how this correlates with the photoluminescence properties. Films were grown by reactive RF sputtering. For the doped films metallic erbium was added to the c-Si target. The structural parameters and the chemical composition of the different samples wer...
Spectroscopic ellipsometry study of the layer structure and impurity content in...
Losurdo, M.; Cerqueira, M. F.; Stepikhova, M.; Alves, E.; Giangregorio, M. M.; Pinto, P.; Ferreira, J. A.Er doped nc-Si thin films have been investigated by spectroscopic ellipsometry (SE). The optical response of Er ions in a nc-Si/SiO matrix has been determined by SE, and it has been used to detect Er contents as low as 0.2 at%. The complex layered nanostructure of nc-Si:Er:O has been resolved and it has been found that it is strongly influenced by the Er-doping and the oxygen in-depth distribution profile. SE ...
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