A porous silicon lm (PS) was investigated by FTIR, Raman and photoluminescence (PL) spectroscopies. The Raman and PL spectra were obtained using four different laser excitations: 488, 514, 633 and 782 nm. The analysis of the first order and second order Raman scattering lines permits to identify the band energy structure of the crystallites inside the PS film. The analysis of PL spectra shows that the intensity...
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