Encontrados 2 documentos, a visualizar página 1 de 1
Structural studies and influence of the structure on the electrical and optical...
Cerqueira, M. F.; Ferreira, J. A.; Adriaenssens, G. J.Microcrystalline silicon thin films were produced by reactive magnetron sputtering on glass substrates under several different conditions (RF power and gas mixture composition). The film structure was studied by X-ray diffractometry (XRD), transmission electron microscopy (TEM) and Raman spectroscopy, allowing the determination of crystal sizes, crystallinity and mechanical strain. These parameters were evaluat...
Optical modulation spectroscopy of hydrogenated microcrystalline silicon
Cerqueira, M. F.; Jansen, John A.; Adriaenssens, G. J.; Ferreira, J. A.The properties of microcrystalline silicon thin films prepared by RF sputtering were investigated by optical modulation spectroscopy at room temperature and the results were correlated with Raman and conductivity measurements. For comparative purposes, a number of good quality PECVD microc-Si:H samples were also investigated. For PECVD samples the OMS signal is very weak, and only measurable for probe beam ener...
| Financiadores do RCAAP | |||||||
|
|
|
|
|
|
||