Author(s):
R. Costa
; S. Sargento
; R. Aguiar
; W. Zhang
Date: 2013
Origin: Electrónica e Telecomunicações
Subject(s): VANETs; field testing; emulation testbed; VANETs; field testing; emulation testbed
Author(s):
R. Costa
; S. Sargento
; R. Aguiar
; W. Zhang
Date: 2013
Origin: Electrónica e Telecomunicações
Subject(s): VANETs; field testing; emulation testbed; VANETs; field testing; emulation testbed
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