Author(s):
C. Rodrigues ; V. Batel
; S. Germano
; I. Monteiro Grillo
; J.L. Pinto
Date: 2012
Origin: Electrónica e Telecomunicações
Subject(s): Enhanced Dynamic Wedges; EDW; dosimetric properties; XiO treatment planning system; TPS; Enhanced Dynamic Wedges; EDW; dosimetric properties; XiO treatment planning system; TPS