Application of X-ray microtomography to the microstructural characterization of...

• Author(s): Velhinho, A. ; Fernandes, F. M. Braz ; Ferreira, S. C. ; Rocha, L. A. ; Vignoles, G. ; Cloetens, P.
• Date: 2006
• Persistent ID: http://hdl.handle.net/1822/8629
• Origin: RepositóriUM - Universidade do Minho
• Subject(s): Composites
• Document Type: Article
• Language: English

Description

This paper provides a brief overview of the possibilities offered by X-ray computed microtomography, and particularly synchrotron radiation X-ray microtomography, regarding metal matrix composite characterization, emphasis being placed in the case of Al-based functionally graded materials. Examples are provided concerning the characterization of the reinforcement population, interfacial properties, in-situ transformation and damage evolution. The specific needs of the technique and limitations to its widespread use are mentioned.