Author(s):
Guedes, A. ; Pinto, A. M. P.
; Vieira, M. F.
; Viana, Filomena
Date: 2003
Persistent ID: http://hdl.handle.net/1822/1568
Origin: RepositóriUM - Universidade do Minho
Subject(s): TiAl; Diffusion brazing; Interface; Hardness