Author(s):
Solovov, V. N. ; Neves, F.
; Chepel, V.
; Lopes, M. I.
; Marques, R. F.
; Policarpo, A. J. P. L.
Date: 2003
Persistent ID: http://hdl.handle.net/10316/4476
Origin: Estudo Geral - Universidade de Coimbra
Subject(s): Photodetectors; Excess noise factor; Avalanche photodiode