Author(s):
Matos, P. F. P. de ; Moreira, P. M. G. P.
; Pina, J. C. P.
; Dias, A. M.
; Castro, P. M. S. T. de
Date: 2004
Persistent ID: http://hdl.handle.net/10316/4437
Origin: Estudo Geral - Universidade de Coimbra
Subject(s): X-ray diffraction; Residual stress; Finite element analysis; Scanning electron microscopy; Striation spacing