A methodology development for the study of near surface stress gradients

• Autor(es): Marques, M. J. ; Dias, A. M. ; Gergaud, P. ; Lebrun, J. L.
• Data: 2000
• Identificador Persistente: http://hdl.handle.net/10316/4305
• Origem: Estudo Geral - Universidade de Coimbra
• Assunto(s): Grazing incidence X-ray diffraction; Residual stress gradients; PVD chromium film
• Tipo de Documento: Artigo
• Idioma: Inglês

Descrição

A modification of the geometry used in the sin2 [psi] technique of X-ray diffraction is described. A modified equation for residual stress determination, including geometric adapted Fij, is presented. This method allows near surface stress gradients determination and is called pseudo-grazing incidence method. The limits of the new technique were first tested on different powder materials with X-ray radiation produced by conventional tubes and by a synchrotron radiation source. The technique was finally applied for the determination of a residual stress profile in a polished molybdenum surface before and after the deposition of a PVD chromium film. http://www.sciencedirect.com/science/article/B6TXD-40GHPVT-C/1/82a45e55041866281a13e3fc1bf8cc4c