Author(s):
Kaushal, A. ; Olhero, S. M.
; Antunes, P.
; Ramalho, A.
; Ferreira, J. M. F.
Date: 2014
Persistent ID: http://hdl.handle.net/10316/27126
Origin: Estudo Geral - Universidade de Coimbra
Subject(s): A. Oxides; A. Electronic materials; D. Microstructure; D. Mechanical properties; D. Dielectric properties