Author(s):
Ribeiro, J.E. ; Monteiro, J.
; Vaz, M.A.P.
; Lopes, H.
; Piloto, P.A.G.
Date: 2006
Persistent ID: http://hdl.handle.net/10198/4346
Origin: Biblioteca Digital do IPB
Subject(s): Residual stress; Optical techniques; Moiré interferometry; ESPI