Author(s):
Ribeiro, J.E. ; Vaz, M.A.P.
; Lopes, H.
; Melo, F.J.M.Q. de
; Monteiro, Jaime
Date: 2010
Persistent ID: http://hdl.handle.net/10198/2718
Origin: Biblioteca Digital do IPB
Subject(s): Optical Methods; ESPI; Moiré interferometry; Digital image correlation; Crack tip