Author(s):
Ribeiro, J.E. ; Monteiro, Jaime
; Vaz, M.A.P.
; Lopes, H.
; Piloto, P.A.G.
Date: 2009
Persistent ID: http://hdl.handle.net/10198/1852
Origin: Biblioteca Digital do IPB
Subject(s): Eelectronic speckle pattern interferometry; Finite-element method; Hole drilling; Residual stresses; Moiré interferometry